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0
索取号：TN14-53/E801/11
作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、
出版社：San Francisco, Calif. : San Francisco Press, c1971.
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0
索取号：TN14-53/E801/10
作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、
出版社：San Francisco : San Francisco Press, [c1969].
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索取号：TN1-53/E906
作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、
出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
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索取号：TN06-53/E802/1970
作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.
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索取号：TN06-53/E801/11
作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0
索取号：TN06-53/E801/10
作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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索取号：TN06-53/E801/9
作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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索取号：
作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、
出版社：Philadelphia, PA : ASTM, c1990.
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索取号：TN019.2-7/E801/1975
作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、
出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
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索取号：TN019.2/E806/1972
作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、
出版社：New York : Institute of Electrical and Electronics Engineers, 1972.
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索取号：TN304.1-53/E801/3
作者：International Symposium on Silicon Materials Science and Technology (3rd : 1977 : Philadelphia、 Pa.)、Huff、 Howard R.、Sirtl、 Erhard.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、
出版社：Princeton, N.J. : Electronics and Electrothermics and Metallurgy Divisions, Electrochemical Society, c1977.
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索取号：TN304.16-53/E701
作者：International Symposium on Boron (1st : 1959 : Asbury Park、 N.J.)、GauĺЕ、 G. K. (Gerhart K.)、Nye、 W. F. (William Frederick)、 1917-、Kohn、 J. A. (Jack Arnold)、 1925-、 Institute for Exploratory Research (U.S.)、
出版社：New York : Plenum Press, 1960.
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索取号：TN304.52/E20041
作者：
出版社：Pittsburgh, Pa. : Materials Research Society, c2002.
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索取号：Q55-532/E20031
作者：International Symposium on PPARs: From Basic Science to Clinical Applications (1st: 2001 : Florence、 Italy)、Fruchart、 J. C. (Jean-Charles)、 1945-、
出版社：Dordrecht ; Boston : Kluwer Academic Pub. ; Milan, Italy : Fondazione Giovanni Lorenzini Medical Science Foundation ; Houston, Tex., U.S.A. : Giovanni Lorenzini Medical Foundation, c2002.
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索取号：TN919.2-532/E20011/2
作者：IEEE/IFIP Network Operations and Management Symposium (8th : 2002 : Florence、 Italy)、Stadler、 Rolf.、Ulema、 Mehmet.、IEEE Communications Society.、International Federation for Information Processing.、
出版社：Piscataway, N.J. : IEEE, c2002.
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索取号：TN7-53/E20071/43.3
作者：Midwest Symposium on Circuits and Systems (43rd : 2000 : Lansing、 Mich.)、IEEE Circuits and Systems Society.、Michigan State University. Dept. of Electrical Engineering.、
出版社：[New York] : Institute of Electrical and Electronics Engineers, c2000.
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